Blueprint for wafer-scale three-dimensional photonic band-gap synthesis by photoelectrochemical etching

Physical Review E - Statistical, Nonlinear, and Soft Matter Physics

Volumn 68, Issue 4 2, 2003, Pages 466071-466076

  Chan, Timothy Y M ^a   John, Sajeev ^a  

^a UNIVERSITY OF TORONTO   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; CRYSTAL LATTICES; ENERGY GAP; ETCHING; PERMITTIVITY; PERTURBATION TECHNIQUES; PHOTOCHEMICAL REACTIONS; PHOTONS; PORE SIZE;

PHOTOELECTROCHEMICAL ETCHING; ZERO THRESHOLD LASERS;

CRYSTALS;

EID: 0346304871     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (26)

1. Sajeev John, Phys. Rev. Lett. 58, 2486 (1987).
2. Eli Yablonovitch, Phys. Rev. Lett. 58, 2059 (1987).
3. Jonathan P. Dowling, Michael Scalora, Mark J. Bloemer, and Charles M. Bowden, J. Appl. Phys. 75, 1896 (1994).
4. Sajeev John and Marian Florescu, J. Opt. A: Pure Appl. Opt. 3, S103 (2001).
5. E. Yablonovitch, T.J. Gmitter, and K.M. Leung, Phys. Rev. Lett. 67, 2295 (1991).
6. K.M. Ho, C.T. Chan, and C.M. Soukoulis, Phys. Rev. Lett. 65, 3152 (1990).
7. C.C. Cheng and A. Scherer, J. Vac. Sci. Technol. B 13, 2696 (1995).
8. C.C. Cheng, A. Scherer, V. Arbet-Engels, and E. Yablonovitch, J. Vac. Sci. Technol. B 14, 4110 (1996).
9. G. Feiertag et al., Appl. Phys. Lett. 71, 1441 (1997).
10. E. Özbay, A. Abeyta, G. Tuttle, M. Tringides, R. Biswas, C.T. Chan, C.M. Soukoulis, and K.M. Ho, Phys. Rev. B 50, 1945 (1994).
11. S.Y. Lin et al., Nature (London) 394, 251 (1998).
12. S. Noda, K. Tomoda, N. Yamamoto, and A. Chutinan, Science 289, 604 (2000).
13. C.T. Chan, K.M. Ho, C.M. Soukoulis, R. Biswas, and M. Sigalas, Solid State Commun. 89, 413 (1994).
14. H. Míguez, A. Blanco, F. Meseguer, C. López, H.M. Yates, M.E. Pemble, V. Fornés, and A. Mifsud, Phys. Rev. B 59, 1563 (1999).
15. A. Blanco et al., Nature (London) 405, 437 (2000).
16. Yu.A. Vlasov, V.N. Astratov, A.V. Baryshev, A.A. Kaplyanskii, O.Z. Karimov, and M.F. Limonov, Phys. Rev. E 61, 5784 (2000).
17. Scott R. Kennedy, Michael J. Brett, Ovidiu Toader, and Sajeev John, Nano Lett. 2, 59 (2002).
18. Ovidiu Toader and Sajeev John, Science 292, 1133 (2001).
19. Ovidiu Toader and Sajeev John, Phys. Rev. E 66, 016610 (2002).
20. M. Christophersen, J. Carstensen, A. Feuerhake, and H. Föll, Mater. Sci, Eng., B B69, 194 (2000).
21. J. Schilling et al., J. Opt. A: Pure Appl. Opt. 3, S121 (2001).
22. U. Grüning, V. Lehmann, and C.M. Engelhardt, Appl. Phys. Lett. 66, 3254 (1995).
23. S. Rowson, A. Chelnokov, C. Cuisin, and J.-M. Lourtioz, IEE Proc.: Optoelectron. 145, 403 (1998).
24. J. Schilling, F. Müller, S. Matthias, R.B. Wehrspohn, and U. Gösele, Appl. Phys. Lett. 78, 1180 (2001).
25. J. M. Ziman, Models of Disorder (Cambridge University Press, Cambridge, 1979), p. 345.
26. S.W. Leonard, J.P. Mondia, H.M. van Driel, O. Toader, S. John, K. Busch, A. Birner, U. Gosele, and V. Lehmann, Phys. Rev. B 61, R2389 (2000).