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Volumn 1 C, Issue , 2003, Pages 1739-1744

Bulk carbon nanotubes for micro anemometry

Author keywords

AC electrophoresis; Carbon nanotube (CNT); Micro anemometry; Micro Nano resolution sensor; Polymer based MWNT embedded sensor

Indexed keywords

ANEMOMETERS; ATOMIC FORCE MICROSCOPY; ELECTRIC POWER UTILIZATION; ELECTRIC RESISTANCE; ELECTROPHORESIS; FREQUENCY RESPONSE; MICROELECTROMECHANICAL DEVICES; MICROSENSORS; POLYSILICON; SCANNING ELECTRON MICROSCOPY;

EID: 0346273765     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (5)

References (11)
  • 5
    • 79955989728 scopus 로고    scopus 로고
    • Directed Placement of Suspended Carbon Nanotubes for Nanometer-scale Assembly
    • L.A. Nagahara, I. Amlani, J. Lewenstein and R.K. Tsui, "Directed Placement of Suspended Carbon Nanotubes for Nanometer-scale Assembly", Applied Physics Letters, Vol. 80, No. 20, pp. 3826-3828 (2002).
    • (2002) Applied Physics Letters , vol.80 , Issue.20 , pp. 3826-3828
    • Nagahara, L.A.1    Amlani, I.2    Lewenstein, J.3    Tsui, R.K.4
  • 7
    • 0036319694 scopus 로고    scopus 로고
    • Dependence of AC Electrophoresis Carbon Nanotube Manipulation on Microelectrode Geometry
    • V.T.S. Wong, Wen J. Li, "Dependence of AC Electrophoresis Carbon Nanotube Manipulation on Microelectrode Geometry", International Journal of Non-linear Sciences and Numerical Simulations, Vol. 3, Nos. 3 -4, pp. 769-774 (2002).
    • (2002) International Journal of Non-linear Sciences and Numerical Simulations , vol.3 , Issue.3-4 , pp. 769-774
    • Wong, V.T.S.1    Li, W.J.2
  • 8
    • 0347727994 scopus 로고    scopus 로고
    • Sun Nanotech Co Ltd, Beijing, P.R. China
    • Sun Nanotech Co Ltd, Beijing, P.R. China.
  • 11
    • 0032868431 scopus 로고    scopus 로고
    • MEMS-based Thermal Shear-stress Sensor with Self-frequency Compensation
    • J.B. Huang, F.K. Jiang, Y.C. Tai, C.M. Ho, "MEMS-based Thermal Shear-stress Sensor with Self-frequency Compensation", Measurement Science and Technology, Vol. 10, No. 8, pp. 687-696 (1999).
    • (1999) Measurement Science and Technology , vol.10 , Issue.8 , pp. 687-696
    • Huang, J.B.1    Jiang, F.K.2    Tai, Y.C.3    Ho, C.M.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.