Synthesis, Crystallographic Studies, and Characterization of K 2Bi8Se13-xSx Solid Solutions

Zeitschrift fur Anorganische und Allgemeine Chemie

Volumn 629, Issue 12-13, 2003, Pages 2222-2228

  Kyratsi, Theodora ^a   Kanatzidis, Mercouri G ^a,b  

^a MICHIGAN STATE UNIVERSITY   (United States)

^b Department of Chemistry   (United States)

Author keywords

Bismuth; Chalcogenides; Selenium; Thermoelectric properties

Indexed keywords

BISMUTH DERIVATIVE; POTASSIUM DERIVATIVE; SELENIUM DERIVATIVE; SULFUR DERIVATIVE;

AQUEOUS SOLUTION; ARTICLE; CONDUCTANCE; CRYSTAL STRUCTURE; ELECTRICITY; ELECTRON MICROSCOPY; MELTING POINT; QUANTITATIVE ANALYSIS; SYNTHESIS; THERMAL ANALYSIS; ULTRAVIOLET SPECTROSCOPY; X RAY ANALYSIS; X RAY CRYSTALLOGRAPHY; X RAY POWDER DIFFRACTION;

EID: 0346154832     PISSN: 00442313     EISSN: None     Source Type: Journal    
DOI: 10.1002/zaac.200300213     Document Type: Article

References (20)

1. (a) M. G. Kanatzidis, Semiconductors and Semimetals, 2000, 69, p. 51
2. (b) D.-Y. Chung, L. Iordanidis, K.-S. Choi, M. G. Kanatzidis, Bull. Kor. Chem. Soc. 1998, 19, 1283.
3. D.-Y. Chung, K.-S. Choi, L. Iordanidis, J. L. Schindler, P. M. Brazis, C. R. Kannewurf, B. Chen, S. Hu, C. Uher, M. G. Kanatzidis, Chem. Mater. 1997, 9, 3060.
4. th International Conference on Thermoelectrics, 619 (1999).
5. Th. Kyratsi, J. S. Dyck, W. Chen, D.-Y. Chung, C. Uher, K. M. Paraskevopoulos, M. G. Kanatzidis, J. Appl. Phys. 2002, 92, 965.
6. Th. Kyratsi, D.-Y. Chung, M. G. Kanatzidis, J. Alloys Compds. 2002, 338, 36.
7. (a) W. W. Wendlandt, H. G. Hecht, Reflectance Spectroscopy; Interscience Publishers: New York, 1966;
8. (b) G. Kortüm, Reflectance Spectroscopy; Springer-Verlag, New York, 1969;
9. (c) S. P. Tandon, J. P. Gupta, Phys. Status Solidi 1970, 38, 363.
10. M. Evain, U-Fit: A cell parameter refinement program, Institut des Materiaux de Nantes, Nantes, France (1992).
11. SMART: 1994, Siemens Analytical X-ray Systems, Inc., Madison, Wisconsin 53719 USA.
12. SAINT: Version 4, 1994-1996, Siemens Analytical Xray Systems, Inc., Madison, Wisconsin 53719 USA.
13. SHELXTL: Version 5, 1994, G. M. Sheldrick, Siemens Analytical X-ray Systems, Inc., Madison, Wisconsin 53719 USA.
14. 14) were not successful.
15. M. G. Kanatzidis, T. J. McCarthy, T. A. Tanzer, L.-H. Chen, L. Iordanidis, T. Hogan, C. R. Kannewurf, C. Uher, B. Chen, Chem. Mat. 1996, 8, 1465.
16. D. Bilc, S. D. Mahanti, M. G. Kanatzidis, P. Larson, submitted for publication.
17. J. A. Van Vechten, T. K. Bergstresser, Phys. Rev. B 1970, 1, 3351.
18. (a) M. Ferhat, F. Bechstedt, Phys. Rev. B 2002, 65, 075213;
19. (b) Y.-M. Yu, S. Nam, B. O, K.-S. Lee, Y. D. Choi, J. Lee, P. Y. Yu, Applied Surface Science 2001, 182, 159;
20. (c) R. Venugopal, B. K. Reddy, D. R. Reddy, Opt. Mat. 2001, 17, 483.