Initial tests of a new X-ray Michelson interferometer

Journal of Applied Crystallography

Volumn 36, Issue 6, 2003, Pages 1432-1439

  Sutter, John P ^a,e   Kuetgens, Ulrich ^b   Materlik, Gerhard ^c   Rostomyan, Armen ^d  

^a DESY   (Germany)

^b PHYSIKALISCH TECHNISCHE BUNDESANSTALT   (Germany)

^c DIAMOND LIGHT SOURCE LTD   (United Kingdom)

^d YEREVAN STATE UNIVERSITY   (Armenia)

^e SPring 8/JASR1 ^*  (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ARTICLE; CRYSTAL; CRYSTAL STRUCTURE; DEVICE; INTERFEROMETER; MATERIALS; RADIATION DETECTION; ROTATION; VIBRATION; VISCOSITY; WAVEFORM; X RAY;

EID: 0346118843     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803020740     Document Type: Article

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