An X-ray interferometer with a large and variable path length difference

Journal of Applied Crystallography

Volumn 34, Issue 2, 2001, Pages 166-171

  Fezzaa, K ^a   Lee, W K ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; DATA ANALYSIS; INTERFEROMETER; MEASUREMENT; SIMULATION; THEORY; X RAY; X RAY ANALYSIS;

EID: 0035075245     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889801002072     Document Type: Article

References (8)

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2. Appel, A. & Bonse, U. (1991). Phys. Rev. Lett. 67, 1673-1676.
3. Mandel, L. (1961). J. Opt. Soc. Am. 51, 1342-1350.
4. Mandel, L. & Wolf, E. (1995). Optical Coherence and Quantum Optics. Cambridge University Press.
5. Momose, A. (1995). Nucl. Instrum. Methods A, 352, 622-628.
6. Perina, J. (1984). Coherence of Light. Dordrecht: D. Reidel.
7. Sinha, S. K., Tolan, M. & Gibaud, A. (1998). Phys. Rev. B, 57, 2740-2758.
8. Yamazaki, H. & Ishikawa, T. (1996). SPIE Proc. 2856, 279-288.