A Michelson interferometer for x-rays capable of high-order measurement

Journal of Applied Crystallography

Volumn 36, Issue 2, 2003, Pages 269-279

  Nusshardt, Michael ^a   Bonse, Ulrich ^a  

^a TU DORTMUND UNIVERSITY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

SILICON;

ANALYTIC METHOD; ARTICLE; CALCULATION; CRYSTAL; FOURIER ANALYSIS; GEOMETRY; MICHELSON INTERFEROMETER; SPECTROSCOPY; X RAY;

EID: 0037395118     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889803000918     Document Type: Article

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