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1
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0027662512
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Solder Ball Connect (SBC) Assemblies under Thermal Loading; 1. Deformation Measurement via Moire Interferometry and Its Interpretation
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Sept
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0346655065
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Hybrid Method for Strain/Stress Analysis in Electronic Packaging Using Moire Interferometry and FEM
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Baltimore, Maryland, June 6-8
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Guo, Y. and C.K. Lim, “Hybrid Method for Strain/Stress Analysis in Electronic Packaging Using Moire Interferometry and FEM,” SEM Spring Conference, Baltimore, Maryland, June 6-8, 1994.
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SEM Spring Conference
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0029231814
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Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging
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Guo. Y., Lahaina. Hawaii, March 26-30
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Guo. Y., “Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging," ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina. Hawaii, March 26-30, 1995.
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ASME International, Intersociety Electronic Packaging Conference & Exhibition
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4
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0346023914
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Thermal Deformation Analysis of Various Electronic Packaging Products by Moire and Microscopic Moire Interferometry
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Han. B. and ASME, Chicago, Illinois, November 6-11
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Han. B. and Y. Guo, “Thermal Deformation Analysis of Various Electronic Packaging Products by Moire and Microscopic Moire Interferometry,” International Mechanical Engineering Congress & Exposition, ASME, Chicago, Illinois, November 6-11, 1994.
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International Mechanical Engineering Congress & Exposition
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Guo, Y.1
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5
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0029231813
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Application of Interferometric Techniques to Verification of Numerical Model for Microelectronics Packaging Design
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Lahaina, Hawaii, March 26-30
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Han. B., Y. Guo, and C.K. Lim, “Application of Interferometric Techniques to Verification of Numerical Model for Microelectronics Packaging Design,” ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30, 1995.
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ASME International, Intersociety Electronic Packaging Conference & Exhibition
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Han, . B.1
Guo, Y.2
Lim, C.K.3
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6
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Springer-Verlag, NY
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High Sensitivity Moire: Experimental Analysis for Mechanics and Materials
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Applications of Optical Methods to Electronic Packaging
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Suhling, J.C. and S.T. Lin, “Applications of Optical Methods to Electronic Packaging,” ASME AWM 1995, pp. 109-114.
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ASME AWM
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Suhling, J.C.1
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0344951659
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High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moire Interferometry
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S, and, Nashville, Tennessee, June 10-12, a
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Zhu, J,S, D.Q. Zou, F.L. Dai, S. Liu, and Y. Guo, “High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moire Interferometry,” SEM's VIII International Congress on Experimental Mechanics, Experimental/Numerical Mechanics in Electronic Packaging, Nashville, Tennessee, June 10-12, 1996a.
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SEM's VIII International Congress on Experimental Mechanics, Experimental/Numerical Mechanics in Electronic Packaging
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Zhu, J1
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Dai, F.L.3
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Guo, Y.5
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10
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0347285209
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High Temperature Deformation Analysis of A Flip-Chip Assembly by Moire Interferometry
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Austin, Texas, Oct. 14-16, b
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Zhu, J.S., D.Q. Zou, F.L. Dai, and S. Liu, "High Temperature Deformation Analysis of A Flip-Chip Assembly by Moire Interferometry,” 19th International Electronics Manufacturing Technology Symposium, Austin, Texas, Oct. 14-16, 1996b.
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19th International Electronics Manufacturing Technology Symposium
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Zhu, J.S.1
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11
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0030381711
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Thermal Behavior Study of Power Plastic Package by High Temperature Moire Interferometry and FEA Modeling
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EEP-Vol. Structural Analysis in Microelectronics and Fiber Optics. Atlanta, Georgia, Nov. 17-22. c
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Zhu, J.S., D.Q. Zou, S. Liu, and J. Benson, "Thermal Behavior Study of Power Plastic Package by High Temperature Moire Interferometry and FEA Modeling,” International Mechanical Engineering Congress and Exposition, EEP-Vol. 16, Structural Analysis in Microelectronics and Fiber Optics. Atlanta, Georgia, Nov. 17-22. 1996c. pp, 141-148.
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International Mechanical Engineering Congress and Exposition
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Zhu, J.S.1
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Benson, J.4
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12
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6244258707
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High Temperature Deformation of Area Array Packages by Moire Interferometry/FEM Hybrid Method
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Kyoto, Japan, Dec. 2-4, d
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Zhu, J.S., D. Zou, F, Dai, S, Liu, and Y,F, Guo, "High Temperature Deformation of Area Array Packages by Moire Interferometry/FEM Hybrid Method," Third VLSI Packaging Workshop of Japan, Kyoto, Japan, Dec. 2-4, 1996d
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Third VLSI Packaging Workshop of Japan
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0344951659
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High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moire Interferometry,”
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Zhu, J.S., D.Q, Zou, F.L, Dai, and S, Liu, "High Temperature Deformation Analysis of High Density Interconnects and Packages by High Density Moire Interferometry,” Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP), Vol, 1, 1997a
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Experimental/Numerical Mechanics in Electronic Packaging (E/NMEP)
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Zhu, J.S.1
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14
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0346023918
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Thermal Deformation and Stress Analysis of a Column Grid Array Package by Hybrid Moire/FEM Method
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S, and, International Mechanical Engineering Congress, Dallas, Nov, 16-21, b
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Zhu, J,S, and S, Liu, "Thermal Deformation and Stress Analysis of a Column Grid Array Package by Hybrid Moire/FEM Method," The 9th Symposium on Mechanics of Surface Mount Assemblies, International Mechanical Engineering Congress, Dallas, Nov, 16-21, 1997b
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The 9th Symposium on Mechanics of Surface Mount Assemblies
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Zhu, J1
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15
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0346023916
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Real Time Monitoring And Simulations of Thermal Deformations in Plastic Package
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Dallas, Nov, 16-21, c
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Zhu, J.S, D.Q, Zou, and S, Liu, "Real Time Monitoring And Simulations of Thermal Deformations in Plastic Package,” International Mechanical Engineering Congress, Dallas, Nov, 16-21, 1997c
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(1997)
International Mechanical Engineering Congress
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Zhu, J.S1
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