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Volumn 1997-V, Issue , 1997, Pages 361-368

REAL TIME MONITORING AND SIMULATION OF THERMAL DEFORMATION IN PLASTIC PACKAGE

Author keywords

[No Author keywords available]

Indexed keywords

CCD CAMERAS; DEFORMATION; ELECTRONICS PACKAGING; FINITE ELEMENT METHOD; INTERFEROMETRY; PACKAGING; PACKAGING MATERIALS; THERMAL CYCLING;

EID: 0346023916     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1115/IMECE1997-1111     Document Type: Conference Paper
Times cited : (2)

References (15)
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  • 2
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    • Baltimore, Maryland, June 6-8
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  • 3
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    • Guo. Y., Lahaina. Hawaii, March 26-30
    • Guo. Y., “Experimental Determination of Effective Coefficients of Thermal Expansion in Electronic Packaging," ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina. Hawaii, March 26-30, 1995.
    • (1995) ASME International, Intersociety Electronic Packaging Conference & Exhibition
  • 4
    • 0346023914 scopus 로고
    • Thermal Deformation Analysis of Various Electronic Packaging Products by Moire and Microscopic Moire Interferometry
    • Han. B. and ASME, Chicago, Illinois, November 6-11
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  • 5
    • 0029231813 scopus 로고
    • Application of Interferometric Techniques to Verification of Numerical Model for Microelectronics Packaging Design
    • Lahaina, Hawaii, March 26-30
    • Han. B., Y. Guo, and C.K. Lim, “Application of Interferometric Techniques to Verification of Numerical Model for Microelectronics Packaging Design,” ASME International, Intersociety Electronic Packaging Conference & Exhibition, Lahaina, Hawaii, March 26-30, 1995.
    • (1995) ASME International, Intersociety Electronic Packaging Conference & Exhibition
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  • 7
    • 0347285210 scopus 로고
    • Applications of Optical Methods to Electronic Packaging
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  • 11
    • 0030381711 scopus 로고    scopus 로고
    • Thermal Behavior Study of Power Plastic Package by High Temperature Moire Interferometry and FEA Modeling
    • EEP-Vol. Structural Analysis in Microelectronics and Fiber Optics. Atlanta, Georgia, Nov. 17-22. c
    • Zhu, J.S., D.Q. Zou, S. Liu, and J. Benson, "Thermal Behavior Study of Power Plastic Package by High Temperature Moire Interferometry and FEA Modeling,” International Mechanical Engineering Congress and Exposition, EEP-Vol. 16, Structural Analysis in Microelectronics and Fiber Optics. Atlanta, Georgia, Nov. 17-22. 1996c. pp, 141-148.
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  • 12
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    • High Temperature Deformation of Area Array Packages by Moire Interferometry/FEM Hybrid Method
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  • 13
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  • 14
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  • 15
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.