Polytype distribution of circumstellar silicon carbide: Microstructural characterization by transmission electron microscopy

Geochimica et Cosmochimica Acta

Volumn 67, Issue 24, 2003, Pages 4743-4767

  Daulton, T L ^a,b   Bernatowicz, T J ^c   Lewis, R S ^d   Messenger, S ^c   Stadermann, F J ^c   Amari, S ^c  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b NAVAL RESEARCH LABORATORY   (United States)

^c WASHINGTON UNIVERSITY   (United States)

^d UNIVERSITY OF CHICAGO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ISOTOPIC ANALYSIS; MICROSTRUCTURE; POLYTYPISM; SILICON; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0346020480     PISSN: 00167037     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0016-7037(03)00272-2     Document Type: Article

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