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Volumn 224, Issue 3-4, 2001, Pages 269-273

Synchrotron white-beam topographic studies of 2H-SiC crystals

Author keywords

A1. X ray topography; A2. Growth from vapor; A2. Single crystal growth; B2. Semiconducting materials

Indexed keywords

CRYSTAL GROWTH; CRYSTAL IMPURITIES; DIFFUSION IN SOLIDS; DISLOCATIONS (CRYSTALS); NUCLEATION; REDUCTION; SILANES; SILICON CARBIDE; SINGLE CRYSTALS; THERMODYNAMICS; VAPORS; VECTORS;

EID: 0035309058     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(01)00971-X     Document Type: Article
Times cited : (4)

References (16)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.