![]() |
Volumn 224, Issue 3-4, 2001, Pages 269-273
|
Synchrotron white-beam topographic studies of 2H-SiC crystals
|
Author keywords
A1. X ray topography; A2. Growth from vapor; A2. Single crystal growth; B2. Semiconducting materials
|
Indexed keywords
CRYSTAL GROWTH;
CRYSTAL IMPURITIES;
DIFFUSION IN SOLIDS;
DISLOCATIONS (CRYSTALS);
NUCLEATION;
REDUCTION;
SILANES;
SILICON CARBIDE;
SINGLE CRYSTALS;
THERMODYNAMICS;
VAPORS;
VECTORS;
BURGERS VECTORS;
METHYLTRICHLOROSILANE;
SYNCHROTRON WHITE BEAM X RAY TOPOGRAPHY (SWBXT);
SEMICONDUCTING SILICON COMPOUNDS;
|
EID: 0035309058
PISSN: 00220248
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-0248(01)00971-X Document Type: Article |
Times cited : (4)
|
References (16)
|