Indirect EELS imaging reaching atomic scale - CaO planar faults in CaTiO3

Ultramicroscopy

Volumn 78, Issue 1-4, 1999, Pages 221-231

  Gu, Hui ^a,b   Čeh, Miran ^c  

^a MAX PLANCK INSTITUTE FOR INTELLIGENT SYSTEMS   (Germany)

^b JAPAN SCIENCE AND TECHNOLOGY AGENCY   (Japan)

^c UNIVERSITY OF LJUBLJANA   (Slovenia)

Author keywords

Effective probe size; ELNES; Spatial difference; Spectrum imaging

Indexed keywords

CRYSTAL DEFECTS; CRYSTAL STRUCTURE; ELECTRONIC STRUCTURE; LIME; SCANNING ELECTRON MICROSCOPY; SPECTRUM ANALYSIS; TRANSMISSION ELECTRON MICROSCOPY;

CALCIUM TITANATE; ELECTRON LOSS NEAR EDGE STRUCTURE (ELNES);

ELECTRON ENERGY LOSS SPECTROSCOPY;

CALCIUM OXIDE; TITANIUM DIOXIDE;

CALCULATION; CONFERENCE PAPER; CRYSTAL; CRYSTAL STRUCTURE; ELECTRON ENERGY LOSS SPECTROSCOPY; IMAGE ANALYSIS; IMAGING; PARTICLE SIZE; STRUCTURE ANALYSIS;

EID: 0345711681     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(99)00022-4     Document Type: Conference Paper

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