Microstructure and microwave surface resistance of typical YBaCuO thin films on sapphire and LaAlO3

Superconductor Science and Technology

Volumn 12, Issue 6, 1999, Pages 366-375

  Kastner G ^a   Schafer C ^a   Senz, St ^a   Kaiser, T ^b   Hein, M A ^b   Lorenz, M ^c   Hochmuth, H ^c   Hesse, D ^a  

^a MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS   (Germany)

^b UNIVERSITY OF WUPPERTAL   (Germany)

^c UNIVERSITY OF LEIPZIG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CERIUM COMPOUNDS; CRITICAL CURRENT DENSITY (SUPERCONDUCTIVITY); DEGRADATION; EPITAXIAL GROWTH; LANTHANUM COMPOUNDS; MICROCRACKS; OPTICAL MICROSCOPY; OXIDE SUPERCONDUCTORS; SAPPHIRE; SPUTTER DEPOSITION; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

MICROWAVE SURFACE RESISTANCE;

SUPERCONDUCTING FILMS;

EID: 0345633617     PISSN: 09532048     EISSN: None     Source Type: Journal    
DOI: 10.1088/0953-2048/12/6/307     Document Type: Article

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