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Applied Physics Letters

Volumn 73, Issue 25, 1998, Pages 3763-3765

Nanocrack junctions in unidirectionally twinned thin films of YBa2Cu3O7-δ on (001) NdGaO3

(5) Koren, G a Polturak, E a Levy, N a Deutscher, G b Zakharov, N D c

a TECHNION ISRAEL INSTITUTE OF TECHNOLOGY (Israel)

b TEL AVIV UNIVERSITY (Israel)

c MAX PLANCK INSTITUTE OF MICROSTRUCTURE PHYSICS (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPY; ATOMIC FORCE MICROSCOPY; CRITICAL CURRENTS; ELECTRIC CONDUCTIVITY; IRRADIATION; JOSEPHSON JUNCTION DEVICES; MAGNETIC FIELDS; MICROCRACKS; THICK FILMS; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; YTTRIUM BARIUM COPPER OXIDES;

MICROWAVE IRRADIATION; NANOCRACK JUNCTIONS;

SUPERCONDUCTING FILMS;

EID: 0032556601 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.122887 Document Type: Article

Times cited : (25)

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