Nanometer scale-electrochromic modification of NiO films using a novel technique of scanning near-field optical microscopy

Solid State Ionics

Volumn 165, Issue 1-4, 2003, Pages 7-13

  Iwata, F ^a   Mikage, K ^a   Sakaguchi, H ^a   Kitao, M ^a   Sasaki, A ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

Atomic force microscopy; Electrochromic film; Laser; Near field optics; Scanning near field optical microscopy

Indexed keywords

AMPLIFIERS (ELECTRONIC); ATOMIC FORCE MICROSCOPY; ELECTROCHROMISM; LIGHT POLARIZATION; NANOSTRUCTURED MATERIALS; OPTICAL MICROSCOPY;

NEAR-FIELD OPTICS;

THIN FILMS;

EID: 0345412000     PISSN: 01672738     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssi.2003.08.010     Document Type: Conference Paper

References (21)

1. Deb S.K. Philos. Mag. 27:1973;801.
2. Gerard P., Deneuville A., Courths R. Thin Solid Films. 71:1980;221.
3. Habib M.A., Maheswari S.P. J. Electrochem. Soc. 138:1991;2029.
4. Kitao M., Yamada S., Yoshida S., Akram H., Urabe K. Sol. Energy Mater. Sol. Cells. 25:1992;241.
5. Paul J.L., Lassegues J.C. J. Solid State Chem. 106:1993;357.
6. Daniel M.F., Desbat B., Lassegues J.C., Garie R. J. Solid State Chem. 73:1988;27.
7. Ohtska M., Goto N., Sato N. J. Electronal. Chem. 287:1990;249.
8. Kitao M., Makifuchi M., Urabe A. Sol. Energy Mater. Sol. Cells. 70:2001;219.
9. Pohol D.W., Denk W., Lanz M. Appl. Phys. Lett. 71:1984;750.
10. Betzig E., Lewis A., Harootunian A., Isaacson M., Kratschmer E. J. Biophys. 49:1986;269.
11. Courjon D., Sarayeddine K., Spajer M., Kratschmer E. Opt. Commun. 71:1989;23.
12. Denk W., Pohl D.W. J. Vac. Sci. Technol. B. 9:1991;510.
13. Sasaki A., Iwata F., Katsumata A., Fujiyasu F. Rev. Sci. Instrum. 68(2):1997;1296.
14. Inouye Y., Kawata S. Opt. Lett. 19:1994;159.
15. Furukawa H., Kawata S. Opt. Commun. 148:1998;221.
16. Crandall R.S., Faughman B.W. Phys. Rev. Lett. 39:1977;232.
17. Wittwer V., Schirmer O.F., Schlotter P. Solid State Commun. 25:1978;977.
18. Nagai J. Proc. Soc. Photo-Opt. Instrum. Eng. 1016:1988;28.
19. Dagata J.A., Schneir J., Harary H.H., Evans C.J., Postek M.T., Bennett J. Appl. Phys. Lett. 56:1990;2001.
20. Matsumoto K., Takahashi S., Ishii M., Hoshi M., Kurokawa A., Ichimura S., Ando A. Jpn. J. Appl. Phys. 34:1995;1387.
21. Vullers P.J.M., Ahlskog M., Haesendonck C.V. Appl. Surf. Sci. 584:1999;144-145.