A stable scanning tunneling microscope designed for investigations of organic thin films in air

Review of Scientific Instruments

Volumn 68, Issue 2, 1997, Pages 1296-1299

  Sasaki, A ^a   Iwata, F ^a   Katsumata, A ^a   Akiyama, T ^a   Fujiyasu, H ^a  

^a SHIZUOKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0005317335     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1147892     Document Type: Article

References (15)

1. N. J. DiNardo, Nanoscale Characterization of Surfaces and Interfaces (VCH, Weinheim, 1994).
2. A. Sasaki, F. Iwata, A. Katsumata, J. Fukaya, H. Aoyama, T. Akiyama, Y. Nakano, and H. Fujiyasu, Jpn. J. Appl. Phys. 32, 2952 (1993).
3. D. P. DiLella, J. H. Wandass, and R. J. Colton, Rev. Sci. Instrum. 60, 997 (1989).
4. G. Binnig and D. P. E. Smith, Rev. Sci. Instrum. 57, 1688 (1986).
5. L. A. Bumm and P. S. Weiss, Rev. Sci. Instrum. 66, 4140 (1995).
6. J. A. Helfrich, S. Adenwalla, J. B. Ketterson, and G. A. Zhitomirsky, Rev. Sci. Instrum. 66, 4880 (1995).
7. M. A. Player and G. Ping, Meas. Sci. Technol. 3, 1205 (1992).
8. S. I. Park and C. F. Quate, Rev. Sci. Instrum. 58, 2011 (1987).
9. G. B. Picotto, S. Desogus, and G. Barbato, Rev. Sci. Instrum. 64, 2699 (1993).
10. G. Binnig, H. Rohrer, Ch. Gerber, and H. Weibel, Phys. Rev. Lett. 49, 57 (1982).
11. M. Okano, K. Kajimura, S. Wakiyama, F. Sakai, W. Mizutani, and M. Ono, J. Vac. Sci. Technol. A 5, 3313 (1987).
12. D. Dunlap, S. Smith, C. Bustamante, J. Tamayo, and R. García, Rev. Sci. Instrum. 66, 4876 (1995).
13. K. Dickmann, F. Denning, and J. Jersch, Rev. Sci. Instrum. 67, 845 (1996).
14. F. Iwata, A. Sasaki, M. Kawaguchi, A. Katsumata, and H. Aoyama, J. Vac. Sci. Technol. B 14, 849 (1996).
15. A. Sasaki, A. Katsumata, F. Iwata, and H. Aoyama, Appl. Phys. Lett. 64, 124 (1994).