Waveband selection for hyperspectral data: Optimal feature selection

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 5106, Issue , 2003, Pages 259-270

  Casasent, David ^a   Chen, Xue Wen ^b  

^a CARNEGIE MELLON UNIVERSITY   (United States)

^b CALIFORNIA STATE UNIVERSITY   (United States)

Author keywords

Feature extraction; Feature reduction; Feature selection; Hyperspectral data; Product inspection

Indexed keywords

ALGORITHMS; DATA REDUCTION; INSPECTION; SPECTRUM ANALYSIS;

HYPERSPECTRAL DATA; PRODUCT INSPECTION;

AUTOMATIC TARGET RECOGNITION;

EID: 0345375601     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.501416     Document Type: Conference Paper

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