Subharmonic gap structure in superconducting scanning tunneling microscope junctions

Solid State Communications

Volumn 129, Issue 5, 2004, Pages 299-303

  Naaman, O ^a   Dynes, R C ^a  

^a UNIVERSITY OF CALIFORNIA   (United States)

Author keywords

C. Scanning tunneling microscope; D. Josephson effect; D. Phase fluctuations; E. Multiple Andreev reflection

Indexed keywords

ELECTRIC CONDUCTANCE; ELECTRODES; ELECTRON TUNNELING; JOSEPHSON JUNCTION DEVICES; MICROWAVES; OSCILLATIONS; SCANNING TUNNELING MICROSCOPY;

JOSEPHSON EFFECT; MULTIPLE ANDREEV REFLECTION; PHASE FLUCTUATIONS; SUBHARMONIC GAP STRUCTURE (SGS); THERMAL FLUCTUATIONS;

ENERGY GAP;

EID: 0345375328     PISSN: 00381098     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ssc.2003.10.022     Document Type: Article

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