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Volumn 12, Issue 6, 1999, Pages 757-766
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The Josephson Effect in Nanoscale Tunnel Junctions
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NONE
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Author keywords
Escape rate; Josephson effect; Phase diffusion; Supercurrent; Switching current
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Indexed keywords
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EID: 0001154656
PISSN: 08961107
EISSN: None
Source Type: Journal
DOI: 10.1023/A:1007733009637 Document Type: Article |
Times cited : (47)
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References (21)
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