Josephson effect in Pb/I/NbSe2 scanning tunneling microscope junctions

International Journal of Modern Physics B

Volumn 17, Issue 18-20 II, 2003, Pages 3569-3574

  Naaman, O ^a   Dynes, R C ^a   Bucher, E ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b NOKIA RESEARCH CENTER   (United States)

Author keywords

Josephson effect; NbSe2; Scanning tunneling microscope

Indexed keywords

CONDUCTOR; CONFERENCE PAPER; CRYSTAL; FILM; METHODOLOGY; REPRODUCIBILITY; SCANNING TUNNELING MICROSCOPY;

EID: 0141567885     PISSN: 02179792     EISSN: None     Source Type: Journal    
DOI: 10.1142/s0217979203021423     Document Type: Conference Paper

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