Observation of strain relaxation phenomena in buried and nonburied III-V surface gratings through high resolution x-ray diffraction

Applied Physics Letters

Volumn 71, Issue 22, 1997, Pages 3227-3229

  Leprince, L ^a   Baumbach, G T ^b   Talneau, A ^a   Gailhanou, M ^c   Schneck, J ^a  

^a ORANGE LABS   (France)

^b EADQ   (Germany)

^c UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001440137     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.120298     Document Type: Article

References (7)

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7. G. T. Baumbach and M. Gailhanou (unpublished).