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Volumn 74, Issue 11, 2003, Pages 4696-4702

Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy

Author keywords

[No Author keywords available]

Indexed keywords

ANALYZERS; LAUE GEOMETRY;

EID: 0344946095     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1618014     Document Type: Article
Times cited : (26)

References (15)
  • 6
    • 36749107588 scopus 로고
    • E. A. Stern and S. M. Heald, Rev. Sci. Instrum. 50, 1579 (1979); E. A. Stern, B. A. Bunker, and S. M. Heald, Phys. Rev. B 21, 5521 (1980).
    • (1979) Rev. Sci. Instrum. , vol.50 , pp. 1579
    • Stern, E.A.1    Heald, S.M.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.