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Volumn 74, Issue 11, 2003, Pages 4696-4702
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Bent silicon crystal in the Laue geometry to resolve x-ray fluorescence for x-ray absorption spectroscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYZERS;
LAUE GEOMETRY;
ABSORPTION SPECTROSCOPY;
ACTINIDES;
BANDWIDTH;
CRYSTALS;
FLUORESCENCE;
NEPTUNIUM;
POISSON RATIO;
SCINTILLATION COUNTERS;
URANIUM;
X RAY SPECTROSCOPY;
SILICON;
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EID: 0344946095
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.1618014 Document Type: Article |
Times cited : (26)
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References (15)
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