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Volumn 763, Issue , 2003, Pages 225-230
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Characterization of transparent and conductive ZnO:Ga thin films produced by rf sputtering at room temperature
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Author keywords
[No Author keywords available]
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Indexed keywords
CARRIER CONCENTRATION;
CRYSTAL ORIENTATION;
CRYSTALLOGRAPHY;
DOPING (ADDITIVES);
FILM GROWTH;
GALLIUM;
HALL EFFECT;
INFRARED SPECTROSCOPY;
MAGNETRON SPUTTERING;
POLYCRYSTALLINE MATERIALS;
SCANNING ELECTRON MICROSCOPY;
SURFACE PHENOMENA;
ULTRAVIOLET SPECTROSCOPY;
FILM THICKNESS;
FOUR POINT PROBE METHOD;
SURFACE PROFILOMETER;
ZINC OXIDE;
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EID: 0344927758
PISSN: 02729172
EISSN: None
Source Type: Conference Proceeding
DOI: None Document Type: Conference Paper |
Times cited : (1)
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References (9)
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