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0345617299
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note
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3): 16.2 ppm, 24.3 ppm, 132.3 ppm, 136.3 ppm, MS: 226 (M+), 193 (M - SH), 161, C, H, N (vs calcd.): 63.68% C (63.66%), 8.00% H (8.00%), 28.22% S (28.32%).
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0344322685
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note
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2 for 30 h.
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0344322687
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note
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All RAIRS substrates consist of a layer of Cr (1-4 nm) and Au (200-300 nm) evaporated onto a borosilicate glass. Before use, all Au substrates are front-side flamed until bright red for 30 to 40 s, producing atomically flat grains of a few microns in diameter with a Au(111) orientation. Just prior to use, all wafers were rinsed in distilled ethanol to remove residual contamination.
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0345617300
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note
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-9 Torr. When performing STM studies of SAM-covered surfaces, precautions must be taken to ensure the tip is not buried in the SAM layer. For the results reported below, this was accomplished by monitoring the noise in the z-piezo feedback voltage and tunnel current during STM topographic scans. Each I(V) data curve plotted is an average of forty individual voltage sweeps taken in quick succession.
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