Atomic force microscopy imaging of hair: Correlations between surface potential and wetting at the nanometer scale

Journal of Colloid and Interface Science

Volumn 269, Issue 2, 2004, Pages 329-335

  Dupres, Vincent ^a   Camesano, Terri ^b   Langevin, Dominique ^a   Checco, Antonio ^c   Guenoun, Patrick ^c  

^a UNIVERSITÉ PARIS SUD   (France)

^b Worcester Polytechnic Institute   (United States)

^c SERVICE DE PHYSIQUE DE L ETAT CONDENSÉ   (France)

Author keywords

Atomic force microscopy; Hair surface; Surface potential; Wetting

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELECTROSTATICS; IMAGING TECHNIQUES; WETTING;

CUTICLES; NANOMETRIC SCALES;

BIOLOGICAL MATERIALS;

ANALYTIC METHOD; ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMICAL PARAMETERS; CORRELATION ANALYSIS; CUTICLE; ELECTRICITY; HAIR; HUMAN; HUMAN TISSUE; NANOTECHNOLOGY; PRIORITY JOURNAL; SURFACE PROPERTY; WET DEPOSITION;

EID: 0344493879     PISSN: 00219797     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jcis.2003.08.018     Document Type: Article

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