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Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 36, Issue 9 SUPPL. B, 1997, Pages 6016-6020

Effect of Y-doping on resistance degradation of multilayer ceramic capacitors with Ni electrodes under the highly accelerated life test

(4) Sato, Shigeki a Nakano, Yukie a Sato, Akira a Nomura, Takeshi a

a TDK CORPORATION (Japan)

Author keywords

Admittance spectroscopy; BaTiO3; Donor; Highly accelerated life test; Multilayer ceramic capacitor; Ni electrodes; Thermally stimulated current

Indexed keywords

ANNEALING; BARIUM TITANATE; DOPING (ADDITIVES); ELECTRIC CONDUCTIVITY OF SOLIDS; ELECTRIC CURRENT MEASUREMENT; ELECTRIC FIELD EFFECTS; ELECTRIC IMPEDANCE; ELECTRIC INSULATION; ELECTRODES; ELECTRON TRANSITIONS; NICKEL; SPECTROSCOPIC ANALYSIS;

HIGHLY ACCELERATED LIFE TEST; THERMALLY STIMULATED CURRENT (TSC);

CERAMIC CAPACITORS;

EID: 0031222161 PISSN: 00214922 EISSN: None Source Type: Journal
DOI: 10.1143/jjap.36.6016 Document Type: Article

Times cited : (56)

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