SCOPUS 정보 검색 플랫폼

Volumn 286, Issue 1-2, 1999, Pages 313-321

Application of resonance-enhanced X-ray standing waves to the study of layered structures by grazing-incidence X-ray reflectometry and secondary radiation

(6) Pełka, Jerzy B a Cedola, Alessia b Lagomarsino, Stefano b Di Fonzo, Silvia c Jark, Werner c Soullié, Gerard c

a INSTITUTE OF PHYSICS (Poland)

b CNR (Italy)

c SINCROTRONE TRIESTE (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

FLUORESCENCE; SURFACE ROUGHNESS; SYNCHROTRON RADIATION; X RAYS;

GRAZING-INCIDENCE X RAY REFLECTOMETRY; PHOTOELECTRONS; RESONANCE-ENHANCED X RAY STANDING WAVES;

MULTILAYERS;

EID: 0344339736 PISSN: 09258388 EISSN: None Source Type: Journal
DOI: 10.1016/S0925-8388(98)01027-5 Document Type: Article

Times cited : (4)

References (18)

1
- 0026417430
- J. Wang, M.J. Bedzyk, T.L. Penner, M. Caffrey, Nature 354 (1991) 377.
- (1991) Nature , vol.354 , pp. 377
- Wang, J.¹ Bedzyk, M.J.² Penner, T.L.³ Caffrey, M.⁴

2
- 13444285568
- D.K.G. De Boer, Phys. Rev. B44 (1991) 498.
- (1991) Phys. Rev. , vol.B44 , pp. 498
- De Boer, D.K.G.¹

3
- 0026941197
- J. Wang, M.J. Bedzyk, M. Caffrey, Science 258 (1992) 775.
- (1992) Science , vol.258 , pp. 775
- Wang, J.¹ Bedzyk, M.J.² Caffrey, M.³

4
- 0030262308
- S. Di Fonzo, W. Jark, S. Lagomarsino, A. Cedola, B. Muller, J.B. Pelka, Thin Solid Films 287 (1996) 288-292.
- (1996) Thin Solid Films , vol.287 , pp. 288-292
- Di Fonzo, S.¹ Jark, W.² Lagomarsino, S.³ Cedola, A.⁴ Muller, B.⁵ Pelka, J.B.⁶

5
- 0345201185
- J.B. Pełka, S. Lagomarsino, W. Jark, J. Domagała, Acta Phys. Polon. A89 (1996) 323-328.
- (1996) Acta Phys. Polon. , vol.A89 , pp. 323-328
- Pełka, J.B.¹ Lagomarsino, S.² Jark, W.³ Domagała, J.⁴

6
- 0345201184
- J.B. Pełka, S. Lagomarsino, A. Cedola, S. Di Fonzo, W. Jark, Acta Phys. Polon. A91 (1997) 851-857.
- (1997) Acta Phys. Polon. , vol.A91 , pp. 851-857
- Pełka, J.B.¹ Lagomarsino, S.² Cedola, A.³ Di Fonzo, S.⁴ Jark, W.⁵

7
- 0031987240
- A. Cedola, S. Lagomarsino, S. Di Fonzo, W. Jark, C. Riekel, P. Deschamps, J. Synchrotron Radiat. 5 (1998) 17-22.
- (1998) J. Synchrotron Radiat. , vol.5 , pp. 17-22
- Cedola, A.¹ Lagomarsino, S.² Di Fonzo, S.³ Jark, W.⁴ Riekel, C.⁵ Deschamps, P.⁶

8
- 0000916344
- W. Jark, S. Di Fonzo, S. Lagomarsino, A. Cedola, E. Di Fabrizio, A. Bram, C. Riekel, J. Appl. Phys. 80 (1996) 4831-4836.
- (1996) J. Appl. Phys. , vol.80 , pp. 4831-4836
- Jark, W.¹ Di Fonzo, S.² Lagomarsino, S.³ Cedola, A.⁴ Di Fabrizio, E.⁵ Bram, A.⁶ Riekel, C.⁷

9
- 36449004484
- Y.P. Feng, S.K. Sinha, E.E. Fullerton, G. Grubel, D. Abernathy, D.P. Siddons, J.B. Hastings, Appl. Phys. Lett. 67 (1995) 3647-3649.
- (1995) Appl. Phys. Lett. , vol.67 , pp. 3647-3649
- Feng, Y.P.¹ Sinha, S.K.² Fullerton, E.E.³ Grubel, G.⁴ Abernathy, D.⁵ Siddons, D.P.⁶ Hastings, J.B.⁷

10
- 0003972070
- Pergamon Press, Oxford, 6th ed.
- M. Born, E. Wolf, Principles of Optics, Pergamon Press, Oxford, 6th ed. 1987 pp. 47, 61.
- (1987) Principles of Optics , pp. 47
- Born, M.¹ Wolf, E.²

11
- 0037708727
- S.I. Zheludeva, M.V. Kovalchuk, N.N. Novikova, A.N. Sosphenov, N.N. Salaschenko, E.A. Shamov, K.A. Prokhorov, E. Burattini, G. Cappuccio, J. Appl. Cryst. 30 (1997) 833-838.
- (1997) J. Appl. Cryst. , vol.30 , pp. 833-838
- Zheludeva, S.I.¹ Kovalchuk, M.V.² Novikova, N.N.³ Sosphenov, A.N.⁴ Salaschenko, N.N.⁵ Shamov, E.A.⁶ Prokhorov, K.A.⁷ Burattini, E.⁸ Cappuccio, G.⁹

12
- 0000429416
- S.I. Zheludeva, M.V. Kovalchuk, N.N. Novikova, A.N. Sosphenov, N.B. Malysheva, N.N. Salaschenko, I.Ya. Platonov, A.D. Aksakhalyan, Kristallografia 40 (1995) 145-158.
- (1995) Kristallografia , vol.40 , pp. 145-158
- Zheludeva, S.I.¹ Kovalchuk, M.V.² Novikova, N.N.³ Sosphenov, A.N.⁴ Malysheva, N.B.⁵ Salaschenko, N.N.⁶ Platonov, I.Ya.⁷ Aksakhalyan, A.D.⁸

13
- 0001288029
- A.W Andreev, I.P. Prudnikov, Kristallografia 41 (1996) 220-229.
- (1996) Kristallografia , vol.41 , pp. 220-229
- Andreev, A.W.¹ Prudnikov, I.P.²

14
- 26144449160
- L.G. Parratt, Phys. Rev. 95 (1954) 359.
- (1954) Phys. Rev. , vol.95 , pp. 359
- Parratt, L.G.¹

15
- 0027685343
- D.K. Bowen, B.K. Tanner, Nanotechnology 4 (1993) 175-182.
- (1993) Nanotechnology , vol.4 , pp. 175-182
- Bowen, D.K.¹ Tanner, B.K.²

16
- 0345201182
- J. Auleytner, K. Godwod, J.B. Pełka, Cryst. Res. Technol. 30 (1995) 483-488.
- (1995) Cryst. Res. Technol. , vol.30 , pp. 483-488
- Auleytner, J.¹ Godwod, K.² Pełka, J.B.³

17
- 0003885146
- Wiley and Sons, Chichester
- D. Briggs, M.P. Seah (Eds.), Practical Surface Analysis By Auger and X-ray Photoelectron Spectroscopy, Wiley and Sons, Chichester, 1987, pp. 484-526.
- (1987) Practical Surface Analysis by Auger and X-ray Photoelectron Spectroscopy , pp. 484-526
- Briggs, D.¹ Seah, M.P.²

18
- 0000834103
- H. Kiessig, Ann. Phys. 10 (1931) 769-772.
- (1931) Ann. Phys. , vol.10 , pp. 769-772
- Kiessig, H.¹

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.