Crystalline properties of MoS2 thin films grown on metallic substrates

Materials Chemistry and Physics

Volumn 58, Issue 3, 1999, Pages 280-284

  Gourmelon, E ^a   Pouzet, J ^a   Bernede, J C ^a   Hadouda, H ^b   Khelil, A ^b   Le Ny, R ^a  

^a UNIVERSITÉ DE NANTES   (France)

^b UNIVERSITY OF ORAN   (Algeria)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL STRUCTURE; CURRENT VOLTAGE CHARACTERISTICS; FILM GROWTH; MULTILAYERS; OHMIC CONTACTS; PROBES; SCANNING ELECTRON MICROSCOPY; STOICHIOMETRY; SUBSTRATES; THICKNESS MEASUREMENT; X RAY DIFFRACTION ANALYSIS; X RAY PHOTOELECTRON SPECTROSCOPY;

ELECTRON PROBE MICROANALYSIS; METALLIC SUBSTRATES; MOLYBDENUM SULFIDE;

MOLYBDENUM COMPOUNDS;

EID: 0344339139     PISSN: 02540584     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0254-0584(99)00010-3     Document Type: Article

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