Preparation and characterization of highly oriented, photoconducting WS2 thin films

Applied Physics A: Materials Science and Processing

Volumn 62, Issue 6, 1996, Pages 543-546

  Ballif, C ^a   Regula, M ^a   Schmid, P E ^a   Remskar, M ^a   Sanjines, R ^a   Levy, F ^a  

^a EPFL   (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; CHARACTERIZATION; FILM PREPARATION; PHOTOCONDUCTING MATERIALS; PHOTOCONDUCTIVITY; QUARTZ; SINGLE CRYSTALS; SPUTTER DEPOSITION; THIN FILMS; TRANSMISSION ELECTRON MICROSCOPY; TUNGSTEN COMPOUNDS; X RAY DIFFRACTION;

EXCITONIC PEAKS; INTERBAND TRANSITIONS; OPTICAL ABSORPTION SPECTRUM; PHOTOCONDUCTING THIN FILMS; ROOM TEMPERATURE;

SEMICONDUCTING FILMS;

EID: 0030173556     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s003390050338     Document Type: Article

References (20)