메뉴 건너뛰기




Volumn 74, Issue 1, 1999, Pages 56-59

High temperature pressure sensor prepared by selective deposition of cubic silicon carbide on SOI substrates

Author keywords

[No Author keywords available]

Indexed keywords

DEPOSITION; DRY ETCHING; SILICON CARBIDE; SUBSTRATES; SURFACES;

EID: 0344146579     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00302-1     Document Type: Article
Times cited : (50)

References (9)
  • 2
    • 0030655310 scopus 로고    scopus 로고
    • The influence of crystal quality on the piezoresistive effect of β-SiC between r.t. and 450°C measured by using microstructures
    • Chicago, USA
    • J. Strass, M. Eickhoff, G. Kroetz, The influence of crystal quality on the piezoresistive effect of β-SiC between r.t. and 450°C measured by using microstructures, Tech. Digest Int. Conf. on Solid-State Sensors and Actuators, Chicago, USA, 1997, p. 1439.
    • (1997) Tech. Digest Int. Conf. on Solid-State Sensors and Actuators , pp. 1439
    • Strass, J.1    Eickhoff, M.2    Kroetz, G.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.