Time-resolved electron microscopy by means of electron counting

Physical Review B - Condensed Matter and Materials Physics

Volumn 56, Issue 9, 1997, Pages 5156-5163

  Osakabe, Nobuyuki ^a   Kodama, Tetsuji ^b  

^a HITACHI LTD   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344129000     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.56.5156     Document Type: Article

References (58)

1. A. E. Lukianov and G. V. Spivak, in Proceedings of 6th International Congress for Electron Microscopy, Kyoto, 1966 (Maruzen, Tokyo, 1966), p. 611.
2. G. S. Plows and W. C. Nixon, J. Phys. E 1, 595 (1968).
3. T. Hosokawa, F. Fujioka, and K. Ura, Rev. Sci. Instrum. 49, 624 (1978).
4. O. Bostanjoglo and Th. Rosin, Phys. Status Solidi A 57, 561 (1980).
5. K. Ura, H. Fujioka, T. Saito, and N. Morimura, J. Electron Microsc. 27, 311 (1978).
6. A. Takaoka and K. Ura, 32, 299 (1983).
7. H. E. Elsayed-Ali and J. W. Herman, Appl. Phys. Lett. 57, 1508 (1990).
8. J. W. Herman and H. E. Elsayed-Ali, Phys. Rev. Lett. 68, 2952 (1992).
9. N. Osakabe, H. Kasai, T. Kodama, and A. Tonomura, Phys. Rev. Lett. 78, 1711 (1997).
10. N. Osakabe, K. Harada, M. I. Lutwyche, H. Kasai, and A. Tonomura, Appl. Phys. Lett. 70, 940 (1997).
11. N. Osakabe, T. Kodama, J. Endo, A. Tonomura, K. Ohbayashi, T. Urakami, S. Ohsuka, H. Tsuchiya, and Y. Tsuchiya, Nucl. Instrum. Methods Phys. Res. A 365, 585 (1995).
12. O. Bostanjoglo and R. Liedtke, Phys. Status Solidi A 60, 451 (1980).
13. O. Bostanjoglo and G. Schlotzhauer, 68, 555 (1981).
14. O. Bostanjoglo, 76, 525 (1983).
15. G. F. Knoll, Radiation Detection and Measurement, 2nd ed. (Wiley, New York, 1989).
16. E. M. Purcell, Nature (London) 178, 1449 (1956).
17. O. Bostanjoglo, G. Schlotzhauer, and S. Schade, Optik (Stuttgart) 61, 91 (1982).
18. P. W. Hawkes and E. Kasper, Principles of Electron Optics (Academic, London, 1989), Vol. 2.
19. K. Harada, T. Matsuda, J. Bonevich, M. Igarashi, S. Kondo, G. Pozzi, U. Kawabe, and A. Tonomura, Nature (London) 350, 51 (1992).
20. J. C. H. Spence, Experimental High Resolution Electron Microscopy (Oxford University Press, Oxford, 1980).
21. A. Migliori, G. Pozzi, and A. Tonomura, Ultramicroscopy 49, 87 (1993).
22. T. Kawasaki, J. Endo, T. Matsuda, and A. Tonomura, Microbeam Anal. 3, 287 (1994).
23. G. Möllenstedt and H. Düker, Naturwissenschaften 42, 41 (1955).
24. N. Osakabe, T. Urakami, T. Kodama, S. Ohsuka, H. Tsuchiya, Y. Tsuchiya, J. Endo, and A. Tonomura (unpublished).
25. M. J. Berger, S. M. Seltzer, S. E. Chappell, J. C. Humphreys, and J. W. Motz, Nucl. Instrum. Methods 69, 181 (1969).
26. N. Osakabe, T. Kodama, T. Urakami, S. Ohsuka, H. Tsuchiya, Y. Tsuchiya, J. Endo, and A. Tonomura (unpublished).
27. R. Asch and N. C. Ford, Rev. Sci. Instrum. 44, 506 (1973).
28. B. Chu, Laser Light Scattering (Academic, Orlando, 1974).
29. K. Ohbayashi, Jpn. J. Appl. Phys. 13, 1219 (1974).
30. See, e.g., J. N. Butler and D. R. Quarrie, Phys. Today 49(10), 50 (1996).
31. T. Kodama, N. Osakabe, J. Endo, A. Tonomura, K. Ohbayashi, T. Urakami, S. Ohsuka, H. Tsuchiya, Y. Tsuchiya, and Y. Uchikawa (unpublished).
32. M. J. Buckingham, Noise in Electronic Devices and Systems (Wiley, New York, 1983).
33. L. W. Swanson and A. E. Bell, in Advances in Electronics and Electron Physics, edited by L. Marton (Academic, New York, 1973) Vol. 32, p. 193.
34. M. P. Silverman, Nuovo Cimento B 97, 200 (1987).
35. M. Born and E. Wolf, Principles of Optics (Pergamon, New York, 1959).
36. R. Humbury-Brown and R. Q. Twiss, Nature (London) 177, 27 (1956).
37. T. Kodama, N. Osakabe, J. Endo, A. Tonomura, K. Ohbayashi, T. Urakami, S. Ohsuka, H. Tsuchiya, Y. Tsuchiya, and Y. Uchikawa (unpublished).
38. M. P. Silverman, Phys. Lett. A 118, 155 (1986).
39. 122, 226 (1987).
40. 148, 154 (1990).
41. T. Matsuda, K. Harada, H. Kasai, O. Kamimura, and A. Tonomura, Science 271, 1393 (1996).
42. K. Harada, O. Kamimura, H. Kasai, T. Matsuda, A. Tonomura, and V. V. Moshchalkov, 274, 1167 (1996).
43. J. E. Bonevich, K. Harada, H. Kasai, T. Matsuda, T. Yoshida, G. Pozzi, and A. Tonomura, Phys. Rev. B 49, 6800 (1994).
44. See, e.g., H. J. Jensen, A. Brass, and A. Berlinsky, Phys. Rev. Lett. 60, 1676 (1988).
45. U. Yaron, P. L. Gammel, D. A. Huse, R. N. Kleiman, C. S. Oglesby, E. Bucher, B. Batlogg, D. J. Bishop, K. Mortensen, and K. N. Clausen, Nature (London) 376, 753 (1995).
46. S. N. Gordeev, P. A. J. de Groot, M. Oussena, A. V. Volkozub, S. Pinfold, R. Langan, R. Gagnon, and L. Taillefer, 385, 324 (1997).
47. R. M. Fleming and C. C. Grimes, Phys. Rev. Lett. 42, 1423 (1979).
48. J. Dumas, C. Schlenker, J. Marcus, and R. Buder, 50, 757 (1983).
49. G. Grüner and A. Zettl, Phys. Rep. 119, 117 (1985).
50. An early review is found in J. R. Clem, Phys. Rep. 75, 1 (1981)
51. T. W. Ebbesen, Phys. Today 49(6), 26 (1996).
52. T. Tiedje, R. R. Haering, and W. N. Hardy, J. Acoust. Soc. Am. 65, 1171 (1979).
53. M. M. J. Treacy, T. W. Ebbesen, and J. M. Gibson, Nature (London) 381, 678 (1996).
54. Y. Martin and H. K. Wickramasinghe, Appl. Phys. Lett. 50, 1455 (1987).
55. B. Yurke, Phys. Rev. Lett. 56, 1515 (1986).
56. M. P. Silverman, Phys. Lett. A 124, 27 (1987).
57. M. Kitagawa and M. Ueda, Phys. Rev. Lett. 67, 1852 (1991).
58. M. Ban, Phys. Rev. A 49, 4142 (1994).