Time-resolved analysis in transmission electron microscopy and its application to the study of the dynamics of vortices

Physical Review Letters

Volumn 78, Issue 9, 1997, Pages 1711-1714

  Osakabe, N ^a   Kasai, H ^a   Kodama, T ^b   Tonomura, A ^a  

^a HITACHI LTD   (Japan)

^b NAGOYA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CURRENT DENSITY; DISLOCATIONS (CRYSTALS); ELECTRIC CURRENT MEASUREMENT; ELECTRON BEAMS; FREE ENERGY; NIOBIUM; PROBABILITY; SUPERCONDUCTING FILMS; VORTEX FLOW;

FLUX CREEP; IMAGE CONTRAST; LORENTZ MICROSCOPY; NIOBIUM FOIL; VORTEX HOPPING;

TRANSMISSION ELECTRON MICROSCOPY;

EID: 0031550708     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.78.1711     Document Type: Article

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