Nanostructuring and hardness investigations of thin films by scanning force microscopy

Acta Physica Polonica A

Volumn 93, Issue 2, 1998, Pages 437-441

  Nowicki, M ^a   Richter, A ^b   Ries, R ^b   Oszwaldowski M ^a  

^a POZNAN UNIVERSITY OF TECHNOLOGY   (Poland)

^b TECHNICAL UNIVERSITY OF APPLIED SCIENCES WILDAU   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0344031050     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.93.437     Document Type: Article

References (11)

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