메뉴 건너뛰기




Volumn 76, Issue 1-3, 1999, Pages 323-328

Measurement of thermal conductivity and diffusivity of single and multilayer membranes

Author keywords

[No Author keywords available]

Indexed keywords

HARMONIC ANALYSIS; SILICON NITRIDE; THERMAL CONDUCTIVITY; THERMAL DIFFUSION; THERMAL VARIABLES MEASUREMENT; THERMOCOUPLES; THERMODYNAMIC PROPERTIES;

EID: 0343496784     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(98)00284-2     Document Type: Article
Times cited : (49)

References (15)
  • 6
    • 0031094623 scopus 로고    scopus 로고
    • Heat transport in thin dielectric films
    • Lee S., Cahill D.G. Heat transport in thin dielectric films. J. Appl. Phys. 81(6):1997;2590-2594.
    • (1997) J. Appl. Phys. , vol.81 , Issue.6 , pp. 2590-2594
    • Lee, S.1    Cahill, D.G.2
  • 9
    • 36449007369 scopus 로고
    • Heat capacity measurement of dielectric solids using a linear surface heater: Application to ferroelectrics
    • Lee S., Kwun S. Heat capacity measurement of dielectric solids using a linear surface heater: Application to ferroelectrics. Rev. Sci. Instrum. 65(4):1994;966-970.
    • (1994) Rev. Sci. Instrum. , vol.65 , Issue.4 , pp. 966-970
    • Lee, S.1    Kwun, S.2
  • 10
    • 0001679381 scopus 로고
    • Thermal conductivity of sputtered oxide films
    • Lee S.M., Cahill D.G., Alen T.H. Thermal conductivity of sputtered oxide films. Phys. Rev. B. 52(1):1995.
    • (1995) Phys. Rev. B , vol.52 , Issue.1
    • Lee, S.M.1    Cahill, D.G.2    Alen, T.H.3
  • 11
    • 0343635648 scopus 로고
    • Thermal conductivity and diffusivity of free standing silicon nitride thin films
    • Ziang X., Grigoropoulos C.P. Thermal conductivity and diffusivity of free standing silicon nitride thin films. Rev. Sci. Instrum. 66(2):1995;1115-1120.
    • (1995) Rev. Sci. Instrum. , vol.66 , Issue.2 , pp. 1115-1120
    • Ziang, X.1    Grigoropoulos, C.P.2
  • 12
    • 0030244075 scopus 로고    scopus 로고
    • Thermal conductivity measurements in thin silicon dioxide films in integrated circuits
    • Kleiner M.B., Kuhn S.A., Weber W. Thermal conductivity measurements in thin silicon dioxide films in integrated circuits. IEEE Trans. Electron Devices. 42(9):1996;1602-1609.
    • (1996) IEEE Trans. Electron Devices , vol.42 , Issue.9 , pp. 1602-1609
    • Kleiner, M.B.1    Kuhn, S.A.2    Weber, W.3
  • 13
    • 36549099049 scopus 로고
    • Thermal conductivity measurements from 30 to 750 K: The 3ω method
    • Cahill D.G. Thermal conductivity measurements from 30 to 750 K: the 3ω method. Rev. Sci. Instrum. 61(2):1990.
    • (1990) Rev. Sci. Instrum. , vol.61 , Issue.2
    • Cahill, D.G.1
  • 14
    • 0342866489 scopus 로고
    • An interferometric calorimeter for thin-film thermal diffusivity measurements
    • Saenger K.L. An interferometric calorimeter for thin-film thermal diffusivity measurements. J. Appl. Phys. 65(4):1989;1447-1452.
    • (1989) J. Appl. Phys. , vol.65 , Issue.4 , pp. 1447-1452
    • Saenger, K.L.1
  • 15
    • 0342432011 scopus 로고
    • Thermal diffusivity measurement of thin films by of an ac calorimetric method
    • L. Hatta, Y. Sasuga, R. Kato, A. Maesono, Thermal diffusivity measurement of thin films by of an ac calorimetric method, Rev. Sci. Instrum. (1985).
    • (1985) Rev. Sci. Instrum.
    • Hatta, L.1    Sasuga, Y.2    Kato, R.3    Maesono, A.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.