-
2
-
-
0030181498
-
Simulation aspects of a thermal accelerometer
-
Dauderstadt U.A., de Vries P.H.S., Hiratsuka R., Korving J.G., Sarro P.M., Baltes H., Middelhoek S. Simulation aspects of a thermal accelerometer. Sensors and Actuators A. 55:1996;3-6.
-
(1996)
Sensors and Actuators A
, vol.55
, pp. 3-6
-
-
Dauderstadt, U.A.1
De Vries, P.H.S.2
Hiratsuka, R.3
Korving, J.G.4
Sarro, P.M.5
Baltes, H.6
Middelhoek, S.7
-
4
-
-
0026851547
-
Design consideration for a thermal accelerometer
-
Hiratsuka R., van Duyn D.C., Otaredian T., de Vries P., Sarro P.M. Design consideration for a thermal accelerometer. Sensors and Actuators A. 32:1992;380-385.
-
(1992)
Sensors and Actuators A
, vol.32
, pp. 380-385
-
-
Hiratsuka, R.1
Van Duyn, D.C.2
Otaredian, T.3
De Vries, P.4
Sarro, P.M.5
-
6
-
-
0031094623
-
Heat transport in thin dielectric films
-
Lee S., Cahill D.G. Heat transport in thin dielectric films. J. Appl. Phys. 81(6):1997;2590-2594.
-
(1997)
J. Appl. Phys.
, vol.81
, Issue.6
, pp. 2590-2594
-
-
Lee, S.1
Cahill, D.G.2
-
9
-
-
36449007369
-
Heat capacity measurement of dielectric solids using a linear surface heater: Application to ferroelectrics
-
Lee S., Kwun S. Heat capacity measurement of dielectric solids using a linear surface heater: Application to ferroelectrics. Rev. Sci. Instrum. 65(4):1994;966-970.
-
(1994)
Rev. Sci. Instrum.
, vol.65
, Issue.4
, pp. 966-970
-
-
Lee, S.1
Kwun, S.2
-
10
-
-
0001679381
-
Thermal conductivity of sputtered oxide films
-
Lee S.M., Cahill D.G., Alen T.H. Thermal conductivity of sputtered oxide films. Phys. Rev. B. 52(1):1995.
-
(1995)
Phys. Rev. B
, vol.52
, Issue.1
-
-
Lee, S.M.1
Cahill, D.G.2
Alen, T.H.3
-
11
-
-
0343635648
-
Thermal conductivity and diffusivity of free standing silicon nitride thin films
-
Ziang X., Grigoropoulos C.P. Thermal conductivity and diffusivity of free standing silicon nitride thin films. Rev. Sci. Instrum. 66(2):1995;1115-1120.
-
(1995)
Rev. Sci. Instrum.
, vol.66
, Issue.2
, pp. 1115-1120
-
-
Ziang, X.1
Grigoropoulos, C.P.2
-
12
-
-
0030244075
-
Thermal conductivity measurements in thin silicon dioxide films in integrated circuits
-
Kleiner M.B., Kuhn S.A., Weber W. Thermal conductivity measurements in thin silicon dioxide films in integrated circuits. IEEE Trans. Electron Devices. 42(9):1996;1602-1609.
-
(1996)
IEEE Trans. Electron Devices
, vol.42
, Issue.9
, pp. 1602-1609
-
-
Kleiner, M.B.1
Kuhn, S.A.2
Weber, W.3
-
13
-
-
36549099049
-
Thermal conductivity measurements from 30 to 750 K: The 3ω method
-
Cahill D.G. Thermal conductivity measurements from 30 to 750 K: the 3ω method. Rev. Sci. Instrum. 61(2):1990.
-
(1990)
Rev. Sci. Instrum.
, vol.61
, Issue.2
-
-
Cahill, D.G.1
-
14
-
-
0342866489
-
An interferometric calorimeter for thin-film thermal diffusivity measurements
-
Saenger K.L. An interferometric calorimeter for thin-film thermal diffusivity measurements. J. Appl. Phys. 65(4):1989;1447-1452.
-
(1989)
J. Appl. Phys.
, vol.65
, Issue.4
, pp. 1447-1452
-
-
Saenger, K.L.1
-
15
-
-
0342432011
-
Thermal diffusivity measurement of thin films by of an ac calorimetric method
-
L. Hatta, Y. Sasuga, R. Kato, A. Maesono, Thermal diffusivity measurement of thin films by of an ac calorimetric method, Rev. Sci. Instrum. (1985).
-
(1985)
Rev. Sci. Instrum.
-
-
Hatta, L.1
Sasuga, Y.2
Kato, R.3
Maesono, A.4
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