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Volumn 385, Issue 1-2, 2001, Pages 190-197

Microstructure, stress and mechanical properties of arc-evaporated Cr-C-N coatings

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; ANNEALING; CARBON; CHROMIUM; COMPRESSIVE STRESS; CRYSTALLINE MATERIALS; ELASTIC MODULI; EVAPORATION; NITROGEN; RESIDUAL STRESSES; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

EID: 0343462248     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(01)00759-3     Document Type: Article
Times cited : (109)

References (29)
  • 8
    • 85031522092 scopus 로고    scopus 로고
    • Ph.D. Thesis, Department of Physics, Linköping University, Sweden
    • L. Karlsson, Ph.D. Thesis, Department of Physics, Linköping University, Sweden (1999).
    • (1999)
    • Karlsson, L.1
  • 11
    • 0003495856 scopus 로고
    • Joint Committee on Powder Diffraction Standards, Swarthmore, PA
    • Powder Diffraction File, Joint Committee on Powder Diffraction Standards, Swarthmore, PA, 1992.
    • (1992) Powder Diffraction File
  • 17
    • 0003472812 scopus 로고
    • Dover Publications, New York, NY
    • B.E. Warren, X-Ray Diffraction, Dover Publications, New York, NY, 1969.
    • (1969) X-Ray Diffraction
    • Warren, B.E.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.