Morphological changes during crystallization and melting of polyoxymethylene studied by synchrotron X-ray scattering and modulated differential scanning calorimetry

Journal of Macromolecular Science - Physics

Volumn 39, Issue , 2000, Pages

  Sauer, Bryan B ^a   Mclean, Robert S ^a   Londono, J David ^a   Hsiao, Benjamin S ^b  

^a DUPONT COMPANY   (United States)

^b STONY BROOK UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLINE MATERIALS; CRYSTALLIZATION; DIFFERENTIAL SCANNING CALORIMETRY; MELTING; MORPHOLOGY; X RAY DIFFRACTION ANALYSIS; X RAY SCATTERING;

POLYOXYMETHYLENE; SYNCHROTRON SMALL ANGLE X RAY SCATTERING; TEMPERATURE MODULATED DIFFERENTIAL SCANNING CALORIMETRY; WIDE ANGLE X RAY DIFFRACTION;

ORGANIC POLYMERS;

EID: 0343279233     PISSN: 00222348     EISSN: None     Source Type: Journal    
DOI: 10.1081/MB-100100402     Document Type: Article

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