Morphological changes during secondary crystallization and subsequent melting in poly(ether ether ketone) as studied by real time small angle X-ray scattering

Macromolecules

Volumn 29, Issue 24, 1996, Pages 7767-7775

  Verrna, Ravi ^a,b,c   Marand, Herve ^a   Hsiao, Benjamin ^b  

^a VIRGINIA POLYTECHNIC INSTITUTE AND STATE UNIVERSITY   (United States)

^b DUPONT COMPANY   (United States)

^c California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS MATERIALS; CORRELATION METHODS; CRYSTAL STRUCTURE; CRYSTALLIZATION; MELTING; MORPHOLOGY; THERMAL EFFECTS; X RAY ANALYSIS;

SECONDARY CRYSTALLIZATION; SMALL ANGLE X RAY SCATTERING (SAXS);

POLYETHER ETHER KETONES;

EID: 0030290036     PISSN: 00249297     EISSN: None     Source Type: Journal    
DOI: 10.1021/ma951727o     Document Type: Article

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