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Volumn 84, Issue 8, 1998, Pages 4448-4451

Positron beam studies of argon irradiated CdS thin films

Author keywords

[No Author keywords available]

Indexed keywords


EID: 0343262033     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.368668     Document Type: Article
Times cited : (2)

References (22)
  • 3
    • 85034299395 scopus 로고    scopus 로고
    • In Ref. 1, Chaps. 7 and 8
    • In Ref. 1, Chaps. 7 and 8.
  • 5
    • 11644276919 scopus 로고
    • Materials Science and Technology, a Comprehensive Treatment
    • VCH, New York
    • Electronic Structure and Properties of Semiconductors, Materials Science and Technology, A Comprehensive Treatment, edited by W. Schroter (VCH, New York, 1991), Vol. 4.
    • (1991) Electronic Structure and Properties of Semiconductors , vol.4
    • Schroter, W.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.