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Journal of Electron Spectroscopy and Related Phenomena

Volumn 104, Issue 1-3, 1999, Pages 173-184

Identification of plasmon modes in two-dimensional Er silicide epitaxially grown on Si(111)

(2) Angot, T a Gewinner, G a

a UNIVERSITÉ DE HAUTE ALSACE (France)

Author keywords

Electron Energy Loss Spectroscopy; Erbium; Plasmon; Silicide; Silicon

Indexed keywords

EID: 0342828462 PISSN: 03682048 EISSN: None Source Type: Journal
DOI: 10.1016/s0368-2048(99)00004-3 Document Type: Article

Times cited : (12)

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