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Volumn 160, Issue 2, 2000, Pages 257-261
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Comparison between the reversal temperature of IBIEC-IBIIA transition and critical temperatures of damage formation in ion irradiated InP and InAs
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Author keywords
[No Author keywords available]
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Indexed keywords
AMORPHIZATION;
CRYSTALLIZATION;
INTERFACES (MATERIALS);
ION BEAMS;
POINT DEFECTS;
SEMICONDUCTING INDIUM PHOSPHIDE;
THERMAL EFFECTS;
INDIUM ARSENIDE;
ION BEAM INDUCED EPITAXIAL CRYSTALLIZATION (IBIEC);
ION BEAM INDUCED INTERFACIAL AMORPHIZATION (IBIIA);
ION BOMBARDMENT;
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EID: 0342756835
PISSN: 0168583X
EISSN: None
Source Type: Journal
DOI: 10.1016/S0168-583X(99)00594-7 Document Type: Article |
Times cited : (9)
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References (20)
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