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Volumn 160, Issue 2, 2000, Pages 257-261

Comparison between the reversal temperature of IBIEC-IBIIA transition and critical temperatures of damage formation in ion irradiated InP and InAs

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHIZATION; CRYSTALLIZATION; INTERFACES (MATERIALS); ION BEAMS; POINT DEFECTS; SEMICONDUCTING INDIUM PHOSPHIDE; THERMAL EFFECTS;

EID: 0342756835     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)00594-7     Document Type: Article
Times cited : (9)

References (20)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.