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Volumn 43, Issue 12, 1999, Pages 2129-2133

Procedure for determining diode parameters at very low forward voltage

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; ELECTRIC CURRENTS; ELECTRIC POTENTIAL;

EID: 0342748385     PISSN: 00381101     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0038-1101(99)00181-1     Document Type: Article
Times cited : (35)

References (10)
  • 2
    • 20644450495 scopus 로고
    • A modified forward I-V plot for Schottky diodes with high series resistance
    • Norde H. A modified forward I-V plot for Schottky diodes with high series resistance. J. Appl. Phys. 50:1979;5052-5053.
    • (1979) J. Appl. Phys. , vol.50 , pp. 5052-5053
    • Norde, H.1
  • 3
    • 0000768265 scopus 로고
    • Generalized Norde plot including determination of the ideality factor
    • Bohlin K.E. Generalized Norde plot including determination of the ideality factor. J. Appl. Phys. 60:1986;1223-1224.
    • (1986) J. Appl. Phys. , vol.60 , pp. 1223-1224
    • Bohlin, K.E.1
  • 4
    • 0001282904 scopus 로고
    • A systematic approach to the measurement of ideality factor, series resistance and barrier heigth for Schottky diodes
    • Lee T.C., Fung S., Beiling Cd, Au H.L. A systematic approach to the measurement of ideality factor, series resistance and barrier heigth for Schottky diodes. J. Appl. Phys. 72:1992;4739-4742.
    • (1992) J. Appl. Phys. , vol.72 , pp. 4739-4742
    • Lee, T.C.1    Fung, S.2    Beiling, Cd.3    Au, H.L.4
  • 5
    • 0029636108 scopus 로고
    • Calculating double-exponential diode model parameters from previously extracted single-exponential model parameters
    • García S.ánchez F.J., Ortiz-Conde A., Liou J.J. Calculating double-exponential diode model parameters from previously extracted single-exponential model parameters. Electron. Lett. 31:1995;71-72.
    • (1995) Electron. Lett. , vol.31 , pp. 71-72
    • García S.ánchez, F.J.1    Ortiz-Conde, A.2    Liou, J.J.3
  • 8
    • 0030086253 scopus 로고    scopus 로고
    • A parasitic series resistance-independent method for device-model parameter extraction
    • García S.ánchez F.J., Ortiz-Conde A., Liou J.J. A parasitic series resistance-independent method for device-model parameter extraction. IEE Proc. Cir. Dev. and Sys. 143:1996;68-70.
    • (1996) IEE Proc. Cir. Dev. and Sys. , vol.143 , pp. 68-70
    • García S.ánchez, F.J.1    Ortiz-Conde, A.2    Liou, J.J.3
  • 10
    • 0032095866 scopus 로고    scopus 로고
    • Simple parameter extraction method for non-ideal Schottky barrier diodes
    • Lee J.I., Brini J., Dimitriadis C.A. Simple parameter extraction method for non-ideal Schottky barrier diodes. Electron. Lett. 34:1998;1268-1269.
    • (1998) Electron. Lett. , vol.34 , pp. 1268-1269
    • Lee, J.I.1    Brini, J.2    Dimitriadis, C.A.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.