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Volumn 12, Issue 9, 1997, Pages 1147-1153
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Simulation of impact ionization breakdown in MESFETS using Monte Carlo methods
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0342641051
PISSN: 02681242
EISSN: None
Source Type: Journal
DOI: 10.1088/0268-1242/12/9/014 Document Type: Article |
Times cited : (5)
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References (19)
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