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Volumn 49, Issue 2, 2001, Pages 299-311

Room temperature mechanical behavior of silicon-doped TiAl alloys with grain sizes in the nano- and submicron-range

Author keywords

[No Author keywords available]

Indexed keywords

BRITTLE FRACTURE; COMMINUTION; DOPING (ADDITIVES); GRAIN SIZE AND SHAPE; INTERMETALLICS; SILICON; THERMOANALYSIS; YIELD STRESS;

EID: 0342468732     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1359-6454(00)00312-8     Document Type: Article
Times cited : (88)

References (66)
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    • (1994) JOM , vol.46 , pp. 30
    • Kim, Y.-W.1
  • 38
    • 85031528962 scopus 로고    scopus 로고
    • Ph.D. dissertation, Technical University of Hamburg-Harburg
    • Bohn, R., Ph.D. dissertation, Technical University of Hamburg-Harburg, 1999.
    • (1999)
    • Bohn, R.1
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    • 0004013464 scopus 로고
    • R.W. Cahn, & P. Haasen. New York: Elsevier Science
    • Weertman J., Weertman J.R. Cahn R.W., Haasen P. Physical Metallurgy. 1983;1309 Elsevier Science, New York.
    • (1983) Physical Metallurgy , pp. 1309
    • Weertman, J.1    Weertman, J.R.2
  • 66
    • 85031531126 scopus 로고
    • Ph.D. dissertation, Technical University of Hamburg-Harburg
    • Th. Pfullmann, Ph.D. dissertation, Technical University of Hamburg-Harburg, 1994.
    • (1994)
    • Pfullmann, Th.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.