Ballistic-electron emission microscopy and internal photoemission in Au/Si-structures - a comparison

Applied Surface Science

Volumn 166, Issue 1, 2000, Pages 108-112

  Blauarmel A ^a   Brauer, M ^a   Hoffmann, V ^a   Schmidt, M ^a  

^a HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON EMISSION; ELECTRON MICROSCOPY; GOLD; PHOTOEMISSION; SEMICONDUCTING FILMS; SEMICONDUCTING SILICON; SUBSTRATES;

BALLISTIC-ELECTRON EMISSION SPECTROSCOPY (BEEM); INTERNAL PHOTOEMISSIONS (IPE);

SCHOTTKY BARRIER DIODES;

EID: 0342409477     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0169-4332(00)00389-5     Document Type: Article

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