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Volumn 78, Issue 1, 1999, Pages 1-7

Deflection of surface-micromachined devices due to internal, homogeneous or gradient stresses

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; BRIDGES; DEFLECTION (STRUCTURES); DEFORMATION; FINITE ELEMENT METHOD; MATHEMATICAL MODELS; MICROMACHINING; STRESS ANALYSIS;

EID: 0342398273     PISSN: 09244247     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0924-4247(99)00197-1     Document Type: Article
Times cited : (44)

References (14)
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    • Mechanical considerations of a micromechanical tuneable InP based WDM filter
    • submitted
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    • A simple technique for the detrmination of mechanical strain in thin films with application to polysilicon
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    • (1985) J. Appl. Phys. , vol.57 , pp. 1671-1675
    • Guckel, H.1    Randazzo, T.2    Burns, D.W.3
  • 5
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    • Diagnostic microstructures for the measurement of intrinsic strain in thin films
    • Guckel H., Burns D., Rutigliano C., Lovell E., Choi B. Diagnostic microstructures for the measurement of intrinsic strain in thin films. J. Micromech. Microeng. 2:1992;86-95.
    • (1992) J. Micromech. Microeng. , vol.2 , pp. 86-95
    • Guckel, H.1    Burns, D.2    Rutigliano, C.3    Lovell, E.4    Choi, B.5
  • 8
    • 0031101760 scopus 로고    scopus 로고
    • High-sensitivity surface micromachined structures for internal stress and stress gradient evaluation
    • Ericson F., Greek S., Söderkvist J., Schweitz J.-Å. High-sensitivity surface micromachined structures for internal stress and stress gradient evaluation. J. Micromech. Microeng. 7:1997;30-36.
    • (1997) J. Micromech. Microeng. , vol.7 , pp. 30-36
    • Ericson, F.1    Greek, S.2    Söderkvist, J.3    Schweitz, J.-Å.4
  • 9
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    • Spiral microstructures for the measurement of average strain gradients in thin films
    • Napa Valley, CA, USA, Feb. 11-14
    • L.-S. Fan, R. Muller, W. Yun, R. Howe, J. Huang, Spiral microstructures for the measurement of average strain gradients in thin films, Tech. Digest, IEEE Micro Electro Mechanical Systems, Napa Valley, CA, USA, Feb. 11-14, 1990, pp. 177-181.
    • (1990) Tech. Digest, IEEE Micro Electro Mechanical Systems , pp. 177-181
    • Fan, L.-S.1    Muller, R.2    Yun, W.3    Howe, R.4    Huang, J.5
  • 10
    • 0029387343 scopus 로고
    • Stress gradient and structural properties of atmospheric and reduced pressure deposited polysilicon layers for micromachined sensors
    • Benrakkad M.S., Lopez-Villegas J.M., Samitier J., Morante J.R., Kirsten M., Lange P. Stress gradient and structural properties of atmospheric and reduced pressure deposited polysilicon layers for micromachined sensors. Sens. Actuators, A. 51:1995;9-12.
    • (1995) Sens. Actuators, a , vol.51 , pp. 9-12
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  • 11
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    • Finite-element method analysis of freestanding microrings for thin-film tensile strain measurements
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    • (1997) J. Micromech. Microeng. , vol.7 , pp. 280-284
    • Boutry, M.1    Bosseboeuf, A.2    Grandchamp, J.P.3    Coffignal, G.4
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    • Characteristics of quasi-buckling
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.