Scanning force microscopy in a liquid on single latent ion tracks: Towards applications in polymers and atomic resolution on crystals

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 166, Issue , 2000, Pages 938-943

  Ohnesorge, F M ^a   Muller A ^a   Neumann, R ^a  

^a GSI HELMHOLTZZENTRUM FÜR SCHWERIONENFORSCHUNG GMBH   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CALCITE; CRYSTAL ATOMIC STRUCTURE; ELASTICITY; ION BEAMS; POLYETHYLENE TEREPHTHALATES; POLYIMIDES; RADIATION EFFECTS;

IONIC CRYSTALS; LATENT ION TRACKS; SCANNING FORCE MICROSCOPY (SFM);

ION BOMBARDMENT;

EID: 0342300211     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0168-583X(99)01153-2     Document Type: Article

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