Radiation hardening of silicon strip detectors

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 514, Issue 1-3, 2003, Pages 38-43

  Yoshida, S ^a   Ohsugi, T ^a   Fukazawa, Y ^a   Yamamura, K ^b   Yamamoto, K ^b   Sato, K ^b  

^a HIROSHIMA UNIVERSITY   (Japan)

^b CENTRAL RESEARCH LABORATORY   (Japan)

Author keywords

GLAST; Radiation damage; Radiation hardening; Silicon strip detector; Surface radiation damage

Indexed keywords

ELECTRON TRAPS; GAMMA RAYS; HOLE MOBILITY; HOLE TRAPS; INTERFACES (MATERIALS); LEAKAGE CURRENTS; RADIATION DAMAGE; RADIATION HARDENING; SILICA; SURFACE PROPERTIES;

INTERFACE TRAPS;

SEMICONDUCTING SILICON;

EID: 0242691888     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2003.08.081     Document Type: Conference Paper

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