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Volumn 42, Issue 31, 2003, Pages 6382-6387

Spectroscopic ellipsometry of metal phthalocyanine thin films

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; ELLIPSOMETRY; EVAPORATION; GLASS; LIGHT REFRACTION;

EID: 0242609024     PISSN: 1559128X     EISSN: 21553165     Source Type: Journal    
DOI: 10.1364/AO.42.006382     Document Type: Article
Times cited : (20)

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