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Volumn 110, Issue , 2003, Pages 477-482

Dynamic properties of solders and solder joints

Author keywords

[No Author keywords available]

Indexed keywords

GRAIN GROWTH; SHEAR STRENGTH; SOLDERED JOINTS; STRAIN RATE;

EID: 0242495771     PISSN: 11554339     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1051/jp4:20020739     Document Type: Conference Paper
Times cited : (27)

References (15)
  • 12
    • 0036296703 scopus 로고    scopus 로고
    • Investigating the drop impact of portable electronic products
    • New Jersey, IEEE, New York
    • C.T. Lim and Y.J. Low. "Investigating the drop impact of portable electronic products". 52nd Electronics Components and Technology Conference, New Jersey, 2002 (IEEE, New York) pp. 1270-1274.
    • (2002) 52nd Electronics Components and Technology Conference , pp. 1270-1274
    • Lim, C.T.1    Low, Y.J.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.