Improved SPR technique for determination of the thickness and optical constants of thin metal films

Optical and Quantum Electronics

Volumn 35, Issue 12, 2003, Pages 1091-1097

  Ding, Y ^a   Cao, Z Q ^a   Shen, Q S ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Metal film; Optical constants; Surface plasmons

Indexed keywords

CALCULATIONS; COMPUTER SIMULATION; INTERFACES (MATERIALS); LIGHT REFLECTION; METALLIC FILMS; OPTICAL COATINGS; PLASTIC FILMS; POLYMETHYL METHACRYLATES; PRISMS;

OPTICAL CONSTANTS; SURFACE PLASMON WAVE; THIN METAL FILM; TOTAL REFLECTION TECHNIQUE;

SURFACE PLASMON RESONANCE;

EID: 0242489519     PISSN: 03068919     EISSN: None     Source Type: Journal    
DOI: 10.1023/A:1026219429050     Document Type: Article

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