CBED and LACBED: Characterization of antiphase boundaries

Ultramicroscopy

Volumn 98, Issue 1, 2003, Pages 9-26

  Morniroli, J P ^a   No M L ^b   Rodriguez P P ^b   San Juan, J ^b   Jezierska, E ^c   Michel, N ^d   Poulat, S ^d   Priester, L ^d  

^a UNIVERSITÉ LILLE 1   (France)

^b UNIVERSITY OF THE BASQUE COUNTRY UPV EHU   (Spain)

^c WARSAW UNIVERSITY OF TECHNOLOGY   (Poland)

^d UNIVERSITÉ PARIS SACLAY   (France)

Author keywords

Convergent beam electron diffraction (CBED); Electron diffraction

Indexed keywords

CHARACTERIZATION; CRYSTAL DEFECTS; ELECTRON DIFFRACTION; GRAIN BOUNDARIES; MATERIALS SCIENCE; STACKING FAULTS;

ANTIPHASE BOUNDARIES (APBS); SUPERLATTICE EXCESS LINES;

MICROSCOPIC EXAMINATION;

ARTICLE; CONVERGENT BEAM ELECTRON DIFFRACTION; CRYSTAL; ELECTRON BEAM; ELECTRON DIFFRACTION; INTERMETHOD COMPARISON; LARGE ANGLE BEAM ELECTRON DIFFRACTION; LIGHT INTENSITY; PREDICTION; THEORY;

EID: 0242426623     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(03)00022-6     Document Type: Article

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