Trace analyses from LACBED patterns

Ultramicroscopy

Volumn 83, Issue 3-4, 2000, Pages 227-243

  Morniroli, J P ^a   Gaillot, F ^a  

^a UNIV LILLE   (France)

Author keywords

CBED; Crystal defects; Electron diffraction

Indexed keywords

CRYSTAL DEFECTS; ELECTRON DIFFRACTION; TRACE ANALYSIS;

LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTION (LACBED) TECHNIQUE;

TRANSMISSION ELECTRON MICROSCOPY;

TRACER;

ANALYTIC METHOD; CRYSTAL; ELECTRON DIFFRACTION; ELECTRON MICROSCOPE; MATHEMATICAL PARAMETERS; ROTATION; SHORT SURVEY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 0034026826     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0304-3991(00)00017-6     Document Type: Article

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